Trace analysis and quality assurance of semiconductor materials
We offer extensive analyzes for solar and non-solar applications.
- Measurement of the carrier lifetime and photoconductivity by MDP (microwave detected photoconductivity)
- Determination of the particle size distribution of comminuted products, granulates or fillings by sieve analysis
- Infrared measurement (IR) for the detection of cracks, inclusions and impurities
- Determination of resistivity and conductivity type
With our experience and our know how we are here for you! Ask us – we are happy to assist you in solving your analysis tasks!Click here for an overview of our products and services.
Pictures: own works, analysis picture jarmoluk under Pixabay licence