Trace analysis and quality assurance of semiconductor materials

We offer extensive analyzes for solar and non-solar applications.

Analyse der Spuren- und Ultra-Spurenwerte im ppb-Bereich mit GDMS
  • Element analysis and trace analysis by glow discharge mass spectroscopy (GDMS / GD-MS) with large element size and high detection strength
  • Measurement of the carrier lifetime and photoconductivity by MDP (microwave detected photoconductivity)
  • Determination of the particle size distribution of comminuted products, granulates or fillings by sieve analysis
  • Infrared measurement (IR) for the detection of cracks, inclusions and impurities
  • Determination of resistivity and conductivity type

GDMS / GD-MS – glow discharge mass spectrometry

  • Determination of impurities in trace and ultra trace areas
  • Detection limits down to the ppb range depending on element and matrix
  • non-destructive fine particle analysis (e.g., in matrix silicon)
  • Analysis of surface contamination
  • Screening analyzes by semiquantitative methods
  • Determination of purities of electrically conductive materials
  • Low-contamination sample preparation by grinding, etching or milling and production of powder compacts
GDMS – Glimmentladungs-Massenspektroskopie

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Pictures: own works, analysis picture jarmoluk under Pixabay licence