Trace analysis and quality assurance of semiconductor materials

We offer extensive analyzes for solar and non-solar applications.

Analyse der Spuren- und Ultra-Spurenwerte im ppb-Bereich mit GDMS
  • Measurement of the carrier lifetime and photoconductivity by MDP (microwave detected photoconductivity)
  • Determination of the particle size distribution of comminuted products, granulates or fillings by sieve analysis
  • Infrared measurement (IR) for the detection of cracks, inclusions and impurities
  • Determination of resistivity and conductivity type

With our experience and our know how we are here for you! Ask us – we are happy to assist you in solving your analysis tasks!

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Pictures: own works, analysis picture jarmoluk under Pixabay licence